20/01/2017
快速精準偵測訊號干擾源
增加新的功能可以不用換新的頻譜!
▲提供雷射介面可以依據待測物上之零件高度上下移動近離(1mm)量測
▲提供CCD介面以圖形介面量測待測物雜訊,在實際的產品照片上顯示各測試點的雜訊准位
▲可拆換探頭,搭配H-Probe, V-Probe, High Sensor Probe, GPS Probe
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Detect signal interference source
fast and accurately
We have New Function about EMI Test that you don’t need to change the new spectrum.
▲Provide laser interface which can be adjusted as close as
possible to 1 mm above the DUT .
▲Provide CCD interface to measure the DUT noise , each
measured noise position can be presented in the actual
product photo.
▲Could assemble probe arrange with H-Probe, V-Probe, High Sensor Probe,and GPS Probe.